Open Technical Day

(Presentation which are approved to be released have links below) 

MAY 31^st, 2007                                                                     

8:00 - 8:30 On site Registration (coffee provided)
8:30 - 8:40 Welcomes and introductions
8:40 - 9:10 Key Note Address - Prof. Hank Walker (Texas A&M)

Session 1 – Advanced DFT Techniques   
9:10 - 9:55 - Presentation 1 - Steve Sunter (LogicVision)
        Title - BIST Techniques for Delay and Jitter in Nanometer Technology ICs
9:55 - 10:40 - Presentation 2 - Kedarnath Balakrishnan (AMD)
        Title - Transition Testing Data Volume Reduction Using Test Point Insertion at RTL
10:40 - 11:15  B R E A K
Session 2 – DFM & Yield Learning          
11:15 - 12:00 - Presentation 3 - Grzegorz Mrugalski (Mentor Graphics)
        Title - Low Power Embedded Deterministic Test
11:45 - 1:30 LUNCH - Free lunch
1:30 - 2:15 - Presentation 4 - Mathias Kamm (Cisco Systems)
        Title - Reducing ASIC NTFs
Session 3 – DFT related topics   
2:15 - 3:30 - Presentation 5 - Calvin Cheung (ASE)
        Title - Stacked - Die testing
3:30 - 3:45  B R E A K
3:45 - 4:30 - Presentation 6 - Krishna Srinivasan (Austin Ventures)
        Title - VCs and the outlook for the Semiconductor industry
4:30 - 5:30 - Panel Discussion                       Referee: Jim Johnson
4:30  - 5:30 Happy Hour during Panel