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April 24
th & 25
th, 2008                                          

Crowne Plaza Hotel, Austin TX                 

If you attended the conference, PLEASE take just a few moments to fill out our small survey to help make this event next year even better!

CLICK HERE for the 2008 survey!

If the presenter gives approval, presentations will be posted on this page before May 10th. Some are already available (see below).

FREE Technical DFT Day (April 25th)
                                        

April 25th, 2008                                                                     

8:00 - 8:30 On site Registration (coffee provided)
8:30 - 8:40 Welcomes and introductions

8:40 - 9:10 Key Note Address - T.W. Williams (Synopsys)

Session 1
9:10 - 9:55 - Presentation 1  - Rob Aiken (ARM)
                 
Title Variability and Defects at Current Technology Nodes
9:55 - 10:40 - Presentation 2 Nur Touba (University of Texas)
                 
Title DFT Test Time Reduction
10:40 - 11:15  B R E A K
Session 2           

11:15 - 12:00 - Presentation 3 Heidi Barnes (Verigy)
                 
Title Testing High Speed Test Interfaces
11:45 - 1:30 LUNCH - Free lunch
1:30 - 2:15 - Presentation 4 Jimmy Wingfield (AMD)
                 
Title TAM for Multiple Identical Cores
2:15 - 3:00 - Presentation 5 Brady Benware (Mentor Graphics)
                  
Title The Role of DFT in Yield
Session 3    

3:00- 3:45  B R E A K
3:45 - 4:30 - Presentation 6 Alfred Crouch (Asset-Intertech)
                 
Title P1687 Overview
4:30 - 5:15 - Presentation 7 Clark Jernigan (Austin Ventures)
                 
Title Semiconductor Business Review and Outlook
5:30 - 6:30 - Panel Discussion                       Referee: Jim Johnson
5:30  - 6:30 Happy Hour during Panel

Vendor Booths open from 8:30am - 6pm


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