8:00 - 8:30 On site Registration (coffee provided)
8:30 - 8:40 Welcomes and introductions
8:40 - 9:10 Key Note Address - T.W. Williams (Synopsys)

Session 1
9:10 - 9:55 - Presentation 1  - Rob Aiken (ARM)
                  Title – Variability and Defects at Current Technology Nodes
9:55 - 10:40 - Presentation 2 – Nur Touba (University of Texas)
                  Title – DFT Test Time Reduction
10:40 - 11:15  B R E A K
Session 2           
11:15 - 12:00 - Presentation 3 – Heidi Barnes (Verigy)
                  Title – Testing High Speed Test Interfaces
11:45 - 1:30 LUNCH - Free lunch
1:30 - 2:15 - Presentation 4 – Jimmy Wingfield (AMD)
                  Title – TAM for Multiple Identical Cores
2:15 - 3:00 - Presentation 5 – Brady Benware (Mentor Graphics)
                  Title – The Role of DFT in Yield
Session 3    
3:00- 3:45  B R E A K
3:45 - 4:30 - Presentation 6 – Alfred Crouch (Asset-Intertech)
                  Title – P1687 Overview
4:30 - 5:15 - Presentation 7 – Clark Jernigan (Austin Ventures)
                  Title – Semiconductor Business Review and Outlook
5:30 - 6:30 - Panel Discussion                       Referee: Jim Johnson
5:30  - 6:30 Happy Hour during Panel